Device for performing performance test on X-ray flat panel detector

The embodiment of the invention discloses a device for performing performance test on an X-ray flat panel detector. The device comprises an X-ray light source, an optical platform, an optical filter, a light ring beam-limiting device, a test device and a detector to be tested, wherein the X-ray ligh...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: CAO DAQUAN, ZHAO BOZHEN, ZHU MEILING, WEI CUNFENG, QIN XIUBO, ZHAO WEI, SUN CUILI, YUAN LULU, WEI LONG, SHU HANG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The embodiment of the invention discloses a device for performing performance test on an X-ray flat panel detector. The device comprises an X-ray light source, an optical platform, an optical filter, a light ring beam-limiting device, a test device and a detector to be tested, wherein the X-ray light source is used for generating X rays with specific energy and divergence angle; the optical filter is fixed at the outlet of the X-ray light source through an optical bench and is used for adjusting the energy spectrum of the X rays; the light ring beam-limiting device is fixed at the outlet of the optical filter through the optical bench and is used for controlling the radiation field of the X rays on the surface of the detector to be tested; and the test device is arranged close to the front end face of the detector to be tested and is used for acquiring the flat field image and the edge image under the conditions of different ray quality and radiation dose and calculating to acquire the corresponding performan