Electrical conduction pattern inspection apparatus and inspection method

Provided is a means for promptly and easily identifying defect locations in a plurality of electrical conduction patterns formed on a board. An electrical conduction pattern inspection apparatus (10) is provided with a supply unit (20) which supplies electrical signals to electrical conduction patte...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	YAMAOKA SHUJI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PRINTED CIRCUITS TESTING
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