Electrical conduction pattern inspection apparatus and inspection method

Provided is a means for promptly and easily identifying defect locations in a plurality of electrical conduction patterns formed on a board. An electrical conduction pattern inspection apparatus (10) is provided with a supply unit (20) which supplies electrical signals to electrical conduction patterns (17) via a first electrode (12); a receiving unit (13) whereby electrical signals applied by the supply unit (20) are all detected from the electrical conduction patterns (17) via a plurality of second electrodes (14) that are disposed, starting from near the first electrode (12), at specified intervals along several electrical conduction patterns (17); an operation unit (24) which scans the first electrode (12) and the second electrodes (14), starting with the first electrical conduction pattern (17) and proceeding to the Nth electrical conduction pattern (17); and a control unit (23) whereby on the basis of electrical signals that are supplied to all electrical conduction patterns (17) and are detected by the