Method for assessing service life of AMOLED (active matrix/organic light emitting diode) microdisplay
The invention discloses a method for assessing the service life of an AMOLED (active matrix/organic light emitting diode) microdisplay, relating to a method for assessing the service life of an OLED (organic light emitting diode) display. The method comprises the steps of: carrying out an accelerate...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a method for assessing the service life of an AMOLED (active matrix/organic light emitting diode) microdisplay, relating to a method for assessing the service life of an OLED (organic light emitting diode) display. The method comprises the steps of: carrying out an accelerated ageing test of a sample; establishing a brightness decay theoretical model for the accelerated ageing process; analyzing the brightness decay theoretical model; and establishing a service life prediction model so as to calculate the half-life period for assessing the service life. |
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