Method for assessing service life of AMOLED (active matrix/organic light emitting diode) microdisplay

The invention discloses a method for assessing the service life of an AMOLED (active matrix/organic light emitting diode) microdisplay, relating to a method for assessing the service life of an OLED (organic light emitting diode) display. The method comprises the steps of: carrying out an accelerate...

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Bibliographische Detailangaben
Hauptverfasser: WANG BOWEI, HU ZANDONG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a method for assessing the service life of an AMOLED (active matrix/organic light emitting diode) microdisplay, relating to a method for assessing the service life of an OLED (organic light emitting diode) display. The method comprises the steps of: carrying out an accelerated ageing test of a sample; establishing a brightness decay theoretical model for the accelerated ageing process; analyzing the brightness decay theoretical model; and establishing a service life prediction model so as to calculate the half-life period for assessing the service life.