Flat line type ion trap mass analyzer based on MEMS (micro electro mechanical system) process and manufacturing method thereof

The invention discloses a flat line type ion trap mass analyzer based on an MEMS (micro electro mechanical system) process and a manufacturing method thereof. The flat line type ion trap mass analyzer based on the MEMS (micro electro mechanical system) process comprises a substrate, a support beam,...

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Hauptverfasser: YIN SHIPING, LIU YOUJIANG, CHENG YUPENG, KONG DEYI, LIU YING, QIAN YUJIE, ZHAO GUI, CHEN RAN, SUN WENJUAN, ZHAO CONG, CHEN CHILAI, LI ZHUANG, WANG DIANLING, DUAN XIUHUA
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a flat line type ion trap mass analyzer based on an MEMS (micro electro mechanical system) process and a manufacturing method thereof. The flat line type ion trap mass analyzer based on the MEMS (micro electro mechanical system) process comprises a substrate, a support beam, an ion focusing electrode, a front gate electrode, a main radio frequency electrode, an auxiliary radio frequency electrode, a rear gate electrode, an ion exit repulsion electrode and an ion exit, wherein the integrated ion focusing electrode reduces ion loss, and the ion capture rate is improved; compared with an external ion focusing lens, an error caused by assembling accuracy is reduced; and the manufacturing method adopts the MEMS process, and the processing accuracy and the yield are improved, thus batch production is easy to realize.