Numerically controlled machine turntable temperature rise property test device and method

The invention relates to a numerically controlled machine turntable temperature rise property test device and a method. The device comprises an angle displacement measurement unit, a temperature measurement unit, an information processing unit and an auxiliary function unit. The angle displacement measurement unit and the temperature measurement unit are respectively connected with the information processing unit through a bus, and the auxiliary function unit is electrically connected with the information processing unit. The temperature measurement unit comprises an infrared lens, an optoisolator, a main photoelectric detector, a reference photoelectric detector and an ambient temperature sensor. The information processing unit comprises a display function module, an amplifying and filtering module and a PLC (programmable logic controller). The auxiliary function unit comprises an interface circuit module and a power supply module. The infrared lens and the optoisolator of the temperature measurement unit ar