Device for detecting parameters on thread-shaped test specimen
The device is used for detecting parameters on a thread-shaped test specimen (1), which is moved through a measuring gap (2) in the longitudinal direction of said specimen. The measuring gap comprises a first measuring cell (3) and a second measuring cell (5) for the detection of parameters. The fir...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | JOSS ROLF |
| description | The device is used for detecting parameters on a thread-shaped test specimen (1), which is moved through a measuring gap (2) in the longitudinal direction of said specimen. The measuring gap comprises a first measuring cell (3) and a second measuring cell (5) for the detection of parameters. The first measuring cell (3) and the second measuring cell (5) are disposed on a common planar carrier (4)or on a circuit board, the plane of which is located perpendicular to the longitudinal direction of the test specimen (1). In this way, the measuring cells (3, 5) can be precisely aligned with each other, and the device is simple and cost-effective to produce. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN102112672BB</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN102112672BB</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN102112672BB3</originalsourceid><addsrcrecordid>eNrjZLBzSS3LTE5VSMsvUkhJLUlNLsnMS1coSCxKzAXyiooV8vMUSjKKUhNTdIszEgtSUxRKUotLFIoLUpMzc1PzeBhY0xJzilN5oTQ3g5Kba4izh25qQX58anFBYnJqXmpJvLOfoYGRoaGRmbmRk5MxUYoAtikxBg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Device for detecting parameters on thread-shaped test specimen</title><source>esp@cenet</source><creator>JOSS ROLF</creator><creatorcontrib>JOSS ROLF</creatorcontrib><description>The device is used for detecting parameters on a thread-shaped test specimen (1), which is moved through a measuring gap (2) in the longitudinal direction of said specimen. The measuring gap comprises a first measuring cell (3) and a second measuring cell (5) for the detection of parameters. The first measuring cell (3) and the second measuring cell (5) are disposed on a common planar carrier (4)or on a circuit board, the plane of which is located perpendicular to the longitudinal direction of the test specimen (1). In this way, the measuring cells (3, 5) can be precisely aligned with each other, and the device is simple and cost-effective to produce.</description><language>chi ; eng</language><subject>CONVEYING ; HANDLING THIN OR FILAMENTARY MATERIAL ; HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS,CABLES ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; NATURAL OR ARTIFICIAL THREADS OR FIBRES ; PACKING ; PERFORMING OPERATIONS ; PHYSICS ; SPINNING ; SPINNING OR TWISTING ; STORING ; TESTING ; TEXTILES ; TRANSPORTING</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20121128&DB=EPODOC&CC=CN&NR=102112672B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20121128&DB=EPODOC&CC=CN&NR=102112672B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JOSS ROLF</creatorcontrib><title>Device for detecting parameters on thread-shaped test specimen</title><description>The device is used for detecting parameters on a thread-shaped test specimen (1), which is moved through a measuring gap (2) in the longitudinal direction of said specimen. The measuring gap comprises a first measuring cell (3) and a second measuring cell (5) for the detection of parameters. The first measuring cell (3) and the second measuring cell (5) are disposed on a common planar carrier (4)or on a circuit board, the plane of which is located perpendicular to the longitudinal direction of the test specimen (1). In this way, the measuring cells (3, 5) can be precisely aligned with each other, and the device is simple and cost-effective to produce.</description><subject>CONVEYING</subject><subject>HANDLING THIN OR FILAMENTARY MATERIAL</subject><subject>HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS,CABLES</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>NATURAL OR ARTIFICIAL THREADS OR FIBRES</subject><subject>PACKING</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>SPINNING</subject><subject>SPINNING OR TWISTING</subject><subject>STORING</subject><subject>TESTING</subject><subject>TEXTILES</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLBzSS3LTE5VSMsvUkhJLUlNLsnMS1coSCxKzAXyiooV8vMUSjKKUhNTdIszEgtSUxRKUotLFIoLUpMzc1PzeBhY0xJzilN5oTQ3g5Kba4izh25qQX58anFBYnJqXmpJvLOfoYGRoaGRmbmRk5MxUYoAtikxBg</recordid><startdate>20121128</startdate><enddate>20121128</enddate><creator>JOSS ROLF</creator><scope>EVB</scope></search><sort><creationdate>20121128</creationdate><title>Device for detecting parameters on thread-shaped test specimen</title><author>JOSS ROLF</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN102112672BB3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2012</creationdate><topic>CONVEYING</topic><topic>HANDLING THIN OR FILAMENTARY MATERIAL</topic><topic>HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS,CABLES</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>NATURAL OR ARTIFICIAL THREADS OR FIBRES</topic><topic>PACKING</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>SPINNING</topic><topic>SPINNING OR TWISTING</topic><topic>STORING</topic><topic>TESTING</topic><topic>TEXTILES</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JOSS ROLF</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JOSS ROLF</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Device for detecting parameters on thread-shaped test specimen</title><date>2012-11-28</date><risdate>2012</risdate><abstract>The device is used for detecting parameters on a thread-shaped test specimen (1), which is moved through a measuring gap (2) in the longitudinal direction of said specimen. The measuring gap comprises a first measuring cell (3) and a second measuring cell (5) for the detection of parameters. The first measuring cell (3) and the second measuring cell (5) are disposed on a common planar carrier (4)or on a circuit board, the plane of which is located perpendicular to the longitudinal direction of the test specimen (1). In this way, the measuring cells (3, 5) can be precisely aligned with each other, and the device is simple and cost-effective to produce.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN102112672BB |
| source | esp@cenet |
| subjects | CONVEYING HANDLING THIN OR FILAMENTARY MATERIAL HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS,CABLES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING NATURAL OR ARTIFICIAL THREADS OR FIBRES PACKING PERFORMING OPERATIONS PHYSICS SPINNING SPINNING OR TWISTING STORING TESTING TEXTILES TRANSPORTING |
| title | Device for detecting parameters on thread-shaped test specimen |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T15%3A41%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=JOSS%20ROLF&rft.date=2012-11-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN102112672BB%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |