Device for detecting parameters on thread-shaped test specimen
The device is used for detecting parameters on a thread-shaped test specimen (1), which is moved through a measuring gap (2) in the longitudinal direction of said specimen. The measuring gap comprises a first measuring cell (3) and a second measuring cell (5) for the detection of parameters. The fir...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The device is used for detecting parameters on a thread-shaped test specimen (1), which is moved through a measuring gap (2) in the longitudinal direction of said specimen. The measuring gap comprises a first measuring cell (3) and a second measuring cell (5) for the detection of parameters. The first measuring cell (3) and the second measuring cell (5) are disposed on a common planar carrier (4)or on a circuit board, the plane of which is located perpendicular to the longitudinal direction of the test specimen (1). In this way, the measuring cells (3, 5) can be precisely aligned with each other, and the device is simple and cost-effective to produce. |
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