Production device, production method, test apparatus and integrated circuit package

The invention relates to a production device, a production method, a test apparatus and an integrated circuit package. Provided is a manufacturing apparatus that manufactures an integrated circuit package by packaging an integrated circuit chip, the manufacturing apparatus comprising a flattening se...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: TANAKA SADAKI, KOGURE YOSHINARI, TAKASU SEIICHI
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to a production device, a production method, a test apparatus and an integrated circuit package. Provided is a manufacturing apparatus that manufactures an integrated circuit package by packaging an integrated circuit chip, the manufacturing apparatus comprising a flattening section that flattens the integrated circuit chip; a holding section that holds a base substrate; a transporting section that transports the flattened integrated circuit chip to load the integrated circuit chip on the base substrate held by the holding section; and a packaging section that packages the integrated circuit chip and the base substrate as the integrated circuit package.