Method and device for detecting at least one variable at least indirectly characterizing the properties of a surface in a material web treatment device and method for optimizing the operating method of a material web treatment device
The invention relates to a method and a device for detecting at least one variable at least indirectly characterizing the properties of a surface (2) in a material web treatment device (5) by determining the reflection behavior, particularly the degree of reflection of the surface (2). The invention...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a method and a device for detecting at least one variable at least indirectly characterizing the properties of a surface (2) in a material web treatment device (5) by determining the reflection behavior, particularly the degree of reflection of the surface (2). The invention is characterized in that by means of at least one emission source (7) the surface (2) is illuminated on at least two different measuring sites (3, 4, 22) and at least one variable at least indirectly characterizing the reflection properties, particularly the degree of reflection of the surface (2) on the individual measuring sites (2, 3, 4) is detected by means of a detector device (12) at the same time. The invention further relates to a method for optimizing a material web treatment device. |
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