Time integrated test system and method

The invention discloses a time integrated test system and a method. The system comprises a time synchronization module and a serial port time test module; the time synchronization module is used for obtaining standard time and ensuring the self time accuracy and stability of the test system; the ser...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SHI YIDONG, FENG YANYUAN, QIAN WEIYONG, ZHANG WENYAO, LI SHIHAN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a time integrated test system and a method. The system comprises a time synchronization module and a serial port time test module; the time synchronization module is used for obtaining standard time and ensuring the self time accuracy and stability of the test system; the serial port time test module is used for testing the time accuracy of a time output port; the serial port time test module comprises a data collection module and a data analysis module; the data collection module is used for collecting an ASCII code or a sexadecimal character string which is transmitted by equipment to be detected at real time and retransmitting the ASCII code or the sexadecimal character string to the data analysis module for processing; and the data analysis module is used for receiving the ASCII code or the sexadecimal character string, extracting time information according to different protocols of the equipment to be detected and a set sampling mode and calculating the time bias of the equipment