Device and method for debugging emitter position of ceilometer
The invention relates to a device and a method for debugging emitter position of a ceilometer. The method comprises the following steps: (1) placing the emitter at a theory position of the focus of a lens so that the emitter emits light rays; (2) after a debugging plate generates reflecting light sp...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The invention relates to a device and a method for debugging emitter position of a ceilometer. The method comprises the following steps: (1) placing the emitter at a theory position of the focus of a lens so that the emitter emits light rays; (2) after a debugging plate generates reflecting light spots reflected by a plane mirror when light beams to be emitted pass through holes of the debugging plate and shine on the plane mirror, moving the plane mirror so that the light spots of different holes fall on the holes positioned on corresponding position of the debugging plate; (3) debugging the position of the emitter according to the relative positions of the reflecting light spots falling on the debugging plate so that the central positions of the reflecting light spots of the different holes are overlaid with the centers of the corresponding holes, the light spots are minimum, and the emitter is positioned at the focus position, i.e. an optimal placed position of the emitter of the ceilometer, of the lens at |
---|