Method and system for processing an image for testing a CDD/CMOS sensor

The invention concerns, in a first aspect, a system for testing an image sensor (1) using an image processing (I1-I3) provided by the sensor (1) during which the same operation is performed for each pixel of the image. The invention is characterized in that it comprises a plurality of processing mod...

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Bibliographische Detailangaben
Hauptverfasser: LECLERCQ JEAN-CLAUDE, HENNES JACQUES, DUFRECHOU LAURENT
Format: Patent
Sprache:chi ; eng
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