Method and system for processing an image for testing a CDD/CMOS sensor
The invention concerns, in a first aspect, a system for testing an image sensor (1) using an image processing (I1-I3) provided by the sensor (1) during which the same operation is performed for each pixel of the image. The invention is characterized in that it comprises a plurality of processing mod...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!