Method and system for processing an image for testing a CDD/CMOS sensor

The invention concerns, in a first aspect, a system for testing an image sensor (1) using an image processing (I1-I3) provided by the sensor (1) during which the same operation is performed for each pixel of the image. The invention is characterized in that it comprises a plurality of processing mod...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	LECLERCQ JEAN-CLAUDE, HENNES JACQUES, DUFRECHOU LAURENT
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION TESTING
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Beschreibung
Zusammenfassung:	The invention concerns, in a first aspect, a system for testing an image sensor (1) using an image processing (I1-I3) provided by the sensor (1) during which the same operation is performed for each pixel of the image. The invention is characterized in that it comprises a plurality of processing modules (MT1-MT4), each module including: a storage unit comprising an image zone (I) wherein the image is to be stored; a processor (P1-P4) connected to the storage unit and adapted to execute said operation on a group of pixels of the image stored in the image zone (I). The invention also concerns a method for testing an image sensor (1) using an image processing (I1-I3) provided by said sensor during which the same operation is performed for each pixel of the image, characterized in that it includes the following steps: storing said image (I1-I3) in a plurality of processing modules (MT1-MT3); and, in each of the processing modules, executing said operation on a group of pixels (a, b, c, d) of said image.