Realizing method of novel enhancement type AlGaN/GaN HEMT device

The invention discloses a realization method for a novel enhancement type AlGaN/GaN HEMT device, relating to the microelectronic technical field. The realization method has low cost, simple technique,good repeatability, high reliability and small damage on materials. The enhancement type HEMT device...

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Bibliographische Detailangaben
Hauptverfasser: DONG ZUODIAN, ZHANG JINCHENG, LU LING, HAO YUE, ZHENG PENGTIAN, WANG CHONG, QIN XUEXUE, ZHANG JINFENG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a realization method for a novel enhancement type AlGaN/GaN HEMT device, relating to the microelectronic technical field. The realization method has low cost, simple technique,good repeatability, high reliability and small damage on materials. The enhancement type HEMT device with high threshold voltage and nano-sized effective channel length can be obtained. The inventionadopts the method of etching a table top after growth of an AlN nucleating layer and a GaN epitaxial layer and before growth of a secondary GaN epitaxial layer and an AlGaN layer to make heterojunctionmaterials on the side face of the table top grow along the nonpolarized direction, thereby the air density of two-dimensional electrons in the heterojunction materials on the side face of the tableto p is greatly reduced. A grid electrode of the device is produced on the side face of the table top; under the condition of no additional voltage on the grid electrode, a conductive channel can notbe switched on or weakly swi