Multi-test point semiconductor test machine station automated setting method

An automatic setting method for a multi-ports semiconductor test apparatus for different test products comprises the following steps of: making the complicated steps of test procedure, information of test products and parameters' setting of the apparatus into corresponding image files respectiv...

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Bibliographische Detailangaben
Hauptverfasser:	LAI JIAHONG, GONG HANZHONG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	An automatic setting method for a multi-ports semiconductor test apparatus for different test products comprises the following steps of: making the complicated steps of test procedure, information of test products and parameters' setting of the apparatus into corresponding image files respectively corresponding to the test products so that the image file is managed by the test apparatus; inputting the identity code on each to-be-tested plate before the product test to start the a series of automatic test procedures. The method can greatly reduce the complicated setting before the product test so as to further ensure the correctness and integrity, and greatly improving the effectiveness of management and efficiency of product test.