Method and equipment for inspecting display substrate
A method and a device for inspecting a display panel are provided to inspect a second signal fail after making signal applying pads for recognizing where a fail is generated between test wires or signal lines, thereby improving reliability of the inspection and removing any additional inspection for...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | A method and a device for inspecting a display panel are provided to inspect a second signal fail after making signal applying pads for recognizing where a fail is generated between test wires or signal lines, thereby improving reliability of the inspection and removing any additional inspection for finding out a place of such a fail. A method for inspecting a display panel includes the steps of checking generation of first signal fail by applying first test signals to test wires(S10,S20), making signal applying pads short in the case of first signal fail(S30), and checking generation of second signal fail by applying second test signals to the test wires(S40,S50). The first signal fail is a defect of at least one of the test wires or signal lines. The second signal fail is a defect of the signal lines(S70c). |
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