Apparatus and method of testing display panel

Apparatus and method of testing display panel

The present invention discloses an apparatus for examining the display board and the method, and it is used to improve the detection capability of the examine technique. The apparatus includes detecting probe unit and conductive film, the detecting probe unit is provided with a plurality of detectin...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: SONG YOUNG WOO,JEONG HWAN KYEONG,YOUN JIN CHUL,JUNG HWA KYU
Format: Patent
Sprache:eng
Schlagworte:
DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING
FREQUENCY-CHANGING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
NON-LINEAR OPTICS
OPTICAL ANALOGUE/DIGITAL CONVERTERS
OPTICAL LOGIC ELEMENTS
OPTICS
PHYSICS
TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF
TESTING
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Beschreibung
Zusammenfassung:The present invention discloses an apparatus for examining the display board and the method, and it is used to improve the detection capability of the examine technique. The apparatus includes detecting probe unit and conductive film, the detecting probe unit is provided with a plurality of detecting probe pin, which is used to exert electrical signal to the multiple signal solder pads formed at the display board, and the conductive film can fore-and-aft moves at the base of the detecting probe unit, wherein the apparatus is provided with the first mode and the second mode, in the first mode because the conductive film moves forward the conductive film is arranged among the multiple signal solder pads and detecting probe pin, and in the second mode because the conductive film moves backward the detecting probe pin is directly connected to the multiple signal solder pads.