Method for determining information on a heat-exposed device

The invention relates to a method for determining information on a heat-exposed device (1) which makes it possible to reliably and simply determine information of the device (1) deterioration. For this purpose, the device temperature is detected, at least one meter (5, 10) is incriminated according...

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1. Verfasser: GONZALEZ VAZ ROCCO,SCHWARZE KLAUS
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creator GONZALEZ VAZ ROCCO,SCHWARZE KLAUS
description The invention relates to a method for determining information on a heat-exposed device (1) which makes it possible to reliably and simply determine information of the device (1) deterioration. For this purpose, the device temperature is detected, at least one meter (5, 10) is incriminated according to an attainable temperature or temperature change. Information on the device (1) deterioration is determined according to the meter state.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN101036167A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN101036167A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN101036167A3</originalsourceid><addsrcrecordid>eNrjZLD2TS3JyE9RSMsvUkhJLUktys3My8xLV8jMA4rkJpZk5ucpAFGiQkZqYoluakVBfnFqClBlWWZyKg8Da1piTnEqL5TmZlB0cw1x9tBNLciPTy0uSExOzUstiXf2MzQwNDA2MzQzdzQmRg0AqU0vTQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for determining information on a heat-exposed device</title><source>esp@cenet</source><creator>GONZALEZ VAZ ROCCO,SCHWARZE KLAUS</creator><creatorcontrib>GONZALEZ VAZ ROCCO,SCHWARZE KLAUS</creatorcontrib><description>The invention relates to a method for determining information on a heat-exposed device (1) which makes it possible to reliably and simply determine information of the device (1) deterioration. For this purpose, the device temperature is detected, at least one meter (5, 10) is incriminated according to an attainable temperature or temperature change. Information on the device (1) deterioration is determined according to the meter state.</description><language>eng</language><subject>ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDEDFOR ELSEWHERE ; CHECKING-DEVICES ; GENERATING RANDOM NUMBERS ; MEASURING ; PHYSICS ; REGISTERING OR INDICATING THE WORKING OF MACHINES ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR ; TIME OR ATTENDANCE REGISTERS ; VOTING OR LOTTERY APPARATUS</subject><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20070912&amp;DB=EPODOC&amp;CC=CN&amp;NR=101036167A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25568,76551</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20070912&amp;DB=EPODOC&amp;CC=CN&amp;NR=101036167A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>GONZALEZ VAZ ROCCO,SCHWARZE KLAUS</creatorcontrib><title>Method for determining information on a heat-exposed device</title><description>The invention relates to a method for determining information on a heat-exposed device (1) which makes it possible to reliably and simply determine information of the device (1) deterioration. For this purpose, the device temperature is detected, at least one meter (5, 10) is incriminated according to an attainable temperature or temperature change. Information on the device (1) deterioration is determined according to the meter state.</description><subject>ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDEDFOR ELSEWHERE</subject><subject>CHECKING-DEVICES</subject><subject>GENERATING RANDOM NUMBERS</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>REGISTERING OR INDICATING THE WORKING OF MACHINES</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><subject>TIME OR ATTENDANCE REGISTERS</subject><subject>VOTING OR LOTTERY APPARATUS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLD2TS3JyE9RSMsvUkhJLUktys3My8xLV8jMA4rkJpZk5ucpAFGiQkZqYoluakVBfnFqClBlWWZyKg8Da1piTnEqL5TmZlB0cw1x9tBNLciPTy0uSExOzUstiXf2MzQwNDA2MzQzdzQmRg0AqU0vTQ</recordid><startdate>20070912</startdate><enddate>20070912</enddate><creator>GONZALEZ VAZ ROCCO,SCHWARZE KLAUS</creator><scope>EVB</scope></search><sort><creationdate>20070912</creationdate><title>Method for determining information on a heat-exposed device</title><author>GONZALEZ VAZ ROCCO,SCHWARZE KLAUS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN101036167A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2007</creationdate><topic>ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDEDFOR ELSEWHERE</topic><topic>CHECKING-DEVICES</topic><topic>GENERATING RANDOM NUMBERS</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>REGISTERING OR INDICATING THE WORKING OF MACHINES</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><topic>TIME OR ATTENDANCE REGISTERS</topic><topic>VOTING OR LOTTERY APPARATUS</topic><toplevel>online_resources</toplevel><creatorcontrib>GONZALEZ VAZ ROCCO,SCHWARZE KLAUS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>GONZALEZ VAZ ROCCO,SCHWARZE KLAUS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for determining information on a heat-exposed device</title><date>2007-09-12</date><risdate>2007</risdate><abstract>The invention relates to a method for determining information on a heat-exposed device (1) which makes it possible to reliably and simply determine information of the device (1) deterioration. For this purpose, the device temperature is detected, at least one meter (5, 10) is incriminated according to an attainable temperature or temperature change. Information on the device (1) deterioration is determined according to the meter state.</abstract><oa>free_for_read</oa></addata></record>
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subjects ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDEDFOR ELSEWHERE
CHECKING-DEVICES
GENERATING RANDOM NUMBERS
MEASURING
PHYSICS
REGISTERING OR INDICATING THE WORKING OF MACHINES
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
TIME OR ATTENDANCE REGISTERS
VOTING OR LOTTERY APPARATUS
title Method for determining information on a heat-exposed device
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-17T06%3A27%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=GONZALEZ%20VAZ%20ROCCO,SCHWARZE%20KLAUS&rft.date=2007-09-12&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN101036167A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true