Method for determining information on a heat-exposed device

The invention relates to a method for determining information on a heat-exposed device (1) which makes it possible to reliably and simply determine information of the device (1) deterioration. For this purpose, the device temperature is detected, at least one meter (5, 10) is incriminated according...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser:	GONZALEZ VAZ ROCCO,SCHWARZE KLAUS
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDEDFOR ELSEWHERE CHECKING-DEVICES GENERATING RANDOM NUMBERS MEASURING PHYSICS REGISTERING OR INDICATING THE WORKING OF MACHINES TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR TIME OR ATTENDANCE REGISTERS VOTING OR LOTTERY APPARATUS
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Beschreibung
Zusammenfassung:	The invention relates to a method for determining information on a heat-exposed device (1) which makes it possible to reliably and simply determine information of the device (1) deterioration. For this purpose, the device temperature is detected, at least one meter (5, 10) is incriminated according to an attainable temperature or temperature change. Information on the device (1) deterioration is determined according to the meter state.