Synchronous radiation single-colour device crystal thermal-dilation deformation detecting method

The invention relates to high sensitive testing technology-- synchrotron radiation momochromator crystal thermal expansion deformation testing method. It transforms crystal reflecting efficiency and reflecting light deflection angle as detecting signal according to heating deformation of momochromat...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	WU ZIYU, YUAN QINGXI, HUANG WANXIA, ZHU PEIPING, WANG QIANYUE, SHU HANG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The invention relates to high sensitive testing technology-- synchrotron radiation momochromator crystal thermal expansion deformation testing method. It transforms crystal reflecting efficiency and reflecting light deflection angle as detecting signal according to heating deformation of momochromator. Using information separating technology, the reflecting efficiency and reflecting light deflection angle alteration would be measured. The momochromator crystal thermal expansion deformation would be calculated according to the tested data.