System for substrate processing with meniscus, vacuum, IPA vapor, drying manifold

An apparatus and method for processing a wafer is provided. The system and method are designed to process a surface of a wafer using a meniscus. The meniscus is controlled and is capable of being moved over the surface of the wafer to enable cleaning, rinsing, chemical processing, and drying. The ap...

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Bibliographische Detailangaben
1. Verfasser: WOODS CARL,GARCIA JAMES P.,DE LARIOS JOHN,RAVKIN MIKE,REDEKER FRED C.,NICKHOU AFSHIN
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:An apparatus and method for processing a wafer is provided. The system and method are designed to process a surface of a wafer using a meniscus. The meniscus is controlled and is capable of being moved over the surface of the wafer to enable cleaning, rinsing, chemical processing, and drying. The apparatus can be defined using a number of configurations to enable specific processing of the wafer surface using the meniscus, and such configurations can include the use of proximity heads.