SYSTEM AND METHOD FOR DETECTING DEFECTS ON IMAGED ITEMS
Embodiments of the invention provide a machine learning based detection system, in which defects can be detected even if the system was not trained for these defects and even in items that were not used to train the system, thereby offering an inherently flexible detection system. Certains modes de...
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| creator | HYATT, YONATAN ESHAR, DAGAN ZOHAV, GIL GINSBURG, RAN |
| description | Embodiments of the invention provide a machine learning based detection system, in which defects can be detected even if the system was not trained for these defects and even in items that were not used to train the system, thereby offering an inherently flexible detection system.
Certains modes de réalisation de l'invention concernent un système de détection basé sur un apprentissage automatique, au moyen duquel des défauts peuvent être détectés même si le système n'a pas été entraîné à détecter ces défauts et même sur des articles qui n'ont pas servi pour entraîner le système, offrant ainsi un système de détection intrinsèquement flexible. |
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| subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | SYSTEM AND METHOD FOR DETECTING DEFECTS ON IMAGED ITEMS |
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