SYSTEM AND METHOD FOR DETECTING DEFECTS ON IMAGED ITEMS

Embodiments of the invention provide a machine learning based detection system, in which defects can be detected even if the system was not trained for these defects and even in items that were not used to train the system, thereby offering an inherently flexible detection system. Certains modes de...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	HYATT, YONATAN, ESHAR, DAGAN, ZOHAV, GIL, GINSBURG, RAN
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Embodiments of the invention provide a machine learning based detection system, in which defects can be detected even if the system was not trained for these defects and even in items that were not used to train the system, thereby offering an inherently flexible detection system. Certains modes de réalisation de l'invention concernent un système de détection basé sur un apprentissage automatique, au moyen duquel des défauts peuvent être détectés même si le système n'a pas été entraîné à détecter ces défauts et même sur des articles qui n'ont pas servi pour entraîner le système, offrant ainsi un système de détection intrinsèquement flexible.