METHODS FOR CONFIRMING CHARGED-PARTICLE GENERATION IN AN INSTRUMENT, AND RELATED INSTRUMENTS

Methods for confirming charged-particle generation in an instrument are provided. A method to confirm charged-particle generation in an instrument includes providing electrical connections to a charged-particle optics system of the instrument while the charged-particle optics system is in a chamber....

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	VANGORDON, JAMES ARTHUR
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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