MODULAR METERING SYSTEM

A metering system (100) that may find use to generate values for measured parameters of materials (104). The metering system (100) may be configured with a metrology device (112, 114) configured to generate a first signal (116) in digital format to convey information about material (104) in a condui...

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Bibliographische Detailangaben
1. Verfasser:	ARTIUCH, ROMAN LEON
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL METERING BY VOLUME PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A metering system (100) that may find use to generate values for measured parameters of materials (104). The metering system (100) may be configured with a metrology device (112, 114) configured to generate a first signal (116) in digital format to convey information about material (104) in a conduit (102). The metering system (100) may also include an accessory (126) coupled with the metrology device (112, 114), the accessory (126) configured to use the information of the first signal (116) to generate a second signal (128), the second signal (128) conveying information that defines a measured parameter for the material (104). In one implementation, the accessory (126) comprises executable instructions that configure the accessory (126) to exchange information with the metrology device (112, 114) so as to verify a regulatory status for the metrology device (112, 114).