SYSTEMS AND METHODS OF MEASURING AND DETERMINING NOISE PARAMETERS

Systems and methods of measuring and determining noise parameters. An exemplary method measures noise data and determines element values of a device noise model for a device under test (DUT), using a test system including an impedance tuner coupled to an input of the DUT for presenting a controllabl...

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Bibliographische Detailangaben
1. Verfasser: SIMPSON, GARY R
Format: Patent
Sprache:eng ; fre
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