METHOD FOR DETERMINING A CONCENTRATION OF METAL IMPURITIES CONTAMINATING A SILICON PRODUCT

A method determines a concentration of metal impurities contaminating a silicon product. The method comprises obtaining a test sample of the silicon product with the metal impurities disposed thereon. The test sample is placed within a first vessel. A first acid solution is added to the first vessel...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WORKMAN, DALE FRANKLIN, KRESZOWSKI, DOUGLAS H, PUEHL, CARL W., III
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	CHEMISTRY COMPOUNDS THEREOF INORGANIC CHEMISTRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING METALLURGY NON-METALLIC ELEMENTS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!