SYSTEM AND METHOD FOR DETERMINING QUALITY OF CALIBRATION PARAMETERS FOR A MAGNETOMETER
A method and system are provided for calibrating a magnetometer. The method comprises applying at least one first test to a new set of calibration parameters; accepting the new set of calibration parameters as an active set of calibration parameters when the new calibration parameters pass the at le...
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Format: | Patent |
Sprache: | eng ; fre |
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Zusammenfassung: | A method and system are provided for calibrating a magnetometer. The method comprises applying at least one first test to a new set of calibration parameters; accepting the new set of calibration parameters as an active set of calibration parameters when the new calibration parameters pass the at least one first test; applying the active set of calibration parameters to a plurality of magnetometer readings to obtain a plurality of values; applying at least one second test to the plurality of values; and calculating a quality measure for the active set of calibration parameters based on an outcome of the at least one second test. |
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