Methods and systems for processing microseismic data
Methods and systems for processing microseismic waveforms. The methods and systems provide determining a measure of waveform fit in the frequency-domain comprising constructing, in the frequency-domain, at least one of an amplitude misfit functional and a cross phase functional between arrivals; and...
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Format: | Patent |
Sprache: | eng ; fre |
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Zusammenfassung: | Methods and systems for processing microseismic waveforms. The methods and systems provide determining a measure of waveform fit in the frequency-domain comprising constructing, in the frequency-domain, at least one of an amplitude misfit functional and a cross phase functional between arrivals; and estimating source parameters and/or model parameters. |
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