APPARATUS AND METHOD FOR OBTAINING A REFLECTANCE PROPERTY INDICATION OF A SAMPLE

A method for obtaining a reflectance property indication of a sample whic h includes making a reflectance measurement of the sample and correcting the reflectance measurement in order to obtain the reflectance property indicat ion. The reflectance measurement represents an observed reflectance of th...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	CURTIS, JAMES BOYD, CHEN, XIAOCAI JOYCE, LI, WEI, CHOW, ROSS
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	A method for obtaining a reflectance property indication of a sample whic h includes making a reflectance measurement of the sample and correcting the reflectance measurement in order to obtain the reflectance property indicat ion. The reflectance measurement represents an observed reflectance of the s ample, the reflectance property indication represents a standardized reflect ance of the sample, and correcting the reflectance measurement accounts for a difference between the standardized reflectance and the observed reflectan ce. An apparatus for making a reflectance measurement of a sample which incl udes a housing defining a viewing port, a temperature control mechanism for controlling the temperature within the interior of the housing, and an optic al reflectometer contained within the interior of the housing. The reflectom eter has a measurement direction and is movable within the housing so that t he measurement direction can be selectively aligned with the viewing port.