OPTICAL MEASURING PROBE FOR PROCESS MONITORING

The invention relates to an optical measuring probe for process monitorin g, having a distal end arranged in the region of a process device with an op ening for light to enter, and a proximal end coupled to a spectrometer, wher ein between the distal and proximal ends of the measuring probe, a shaft...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	TUPS, HANS, TOSCH, STEPHAN, BRAND, MARCUS, GROSS, REINHARD
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	The invention relates to an optical measuring probe for process monitorin g, having a distal end arranged in the region of a process device with an op ening for light to enter, and a proximal end coupled to a spectrometer, wher ein between the distal and proximal ends of the measuring probe, a shaft is arranged which comprises a light-conducting connection between the two ends. The measuring probe is characterized by having a reduced outer diameter rel ative to the shaft in the distal region and/or the proximal end of the measu ring probe.