QUANTITATIVE ANALYSIS OF SURFACE-DERIVED SAMPLES USING MASS SPECTROMETRY

A substrate incorporating an internal standard facilitates quantitating analytes in a sample by surface-interrogating mass spectrometry techniques without wet chemistry sample preparation. The user disposes a sample to be analyzed onto the surface of the pretreated substrate. Then the sample-bearing...

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Bibliographische Detailangaben
1. Verfasser:	CERDA, BLAS
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TESTING
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Beschreibung
Zusammenfassung:	A substrate incorporating an internal standard facilitates quantitating analytes in a sample by surface-interrogating mass spectrometry techniques without wet chemistry sample preparation. The user disposes a sample to be analyzed onto the surface of the pretreated substrate. Then the sample-bearing solid substrate, which incorporates an internal standard for each analyte to be quantitated, is ready for interrogation.