METHOD AND SYSTEM FOR LOCATING A STRUCTURE OF INTEREST IN ANINTEGRATED CIRCUIT

A method and system for locating a structure of interest in an integrated circuit uses controlled stimulation of the integrated circuit to stimulate electrical activity in the structure of interest while monitoring electromagnetic waves emitted by the integrated circuit in response to the controlled...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	BRETON, PIERETTE, IOUDOVSKI, ALEXEI
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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