METHOD AND SYSTEM FOR LOCATING A STRUCTURE OF INTEREST IN ANINTEGRATED CIRCUIT

METHOD AND SYSTEM FOR LOCATING A STRUCTURE OF INTEREST IN ANINTEGRATED CIRCUIT

A method and system for locating a structure of interest in an integrated circuit uses controlled stimulation of the integrated circuit to stimulate electrical activity in the structure of interest while monitoring electromagnetic waves emitted by the integrated circuit in response to the controlled...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: BRETON, PIERETTE, IOUDOVSKI, ALEXEI
Format: Patent
Sprache:eng ; fre
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A method and system for locating a structure of interest in an integrated circuit uses controlled stimulation of the integrated circuit to stimulate electrical activity in the structure of interest while monitoring electromagnetic waves emitted by the integrated circuit in response to the controlled stimulation. Analysis of the electromagnetic wave emissions permits a location of the structure of interest to be predicted.