METHOD AND SYSTEM FOR LOCATING A STRUCTURE OF INTEREST IN ANINTEGRATED CIRCUIT

METHOD AND SYSTEM FOR LOCATING A STRUCTURE OF INTEREST IN ANINTEGRATED CIRCUIT

A method and system for locating a structure of interest in an integrated circuit uses controlled stimulation of the integrated circuit to stimulate electrical activity in the structure of interest while monitoring electromagnetic waves emitted by the integrated circuit in response to the controlled...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: BRETON, PIERETTE, IOUDOVSKI, ALEXEI
Format: Patent
Sprache:eng ; fre
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator BRETON, PIERETTE
IOUDOVSKI, ALEXEI
description A method and system for locating a structure of interest in an integrated circuit uses controlled stimulation of the integrated circuit to stimulate electrical activity in the structure of interest while monitoring electromagnetic waves emitted by the integrated circuit in response to the controlled stimulation. Analysis of the electromagnetic wave emissions permits a location of the structure of interest to be predicted.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CA2540238A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CA2540238A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CA2540238A13</originalsourceid><addsrcrecordid>eNrjZPDzdQ3x8HdRcPRzUQiODA5x9VVw8w9S8PF3dgzx9HNXcFQIDgkKdQ4JDXJV8HdT8PQLcQ1yDQ4BMoBaQDz3IMcQVxcFZ88g51DPEB4G1rTEnOJUXijNzaDg5hri7KGbWpAfn1pckJicmpdaEu_saGRqYmBkbOFoaEyEEgCy7y3x</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD AND SYSTEM FOR LOCATING A STRUCTURE OF INTEREST IN ANINTEGRATED CIRCUIT</title><source>esp@cenet</source><creator>BRETON, PIERETTE ; IOUDOVSKI, ALEXEI</creator><creatorcontrib>BRETON, PIERETTE ; IOUDOVSKI, ALEXEI</creatorcontrib><description>A method and system for locating a structure of interest in an integrated circuit uses controlled stimulation of the integrated circuit to stimulate electrical activity in the structure of interest while monitoring electromagnetic waves emitted by the integrated circuit in response to the controlled stimulation. Analysis of the electromagnetic wave emissions permits a location of the structure of interest to be predicted.</description><language>eng ; fre</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20070915&amp;DB=EPODOC&amp;CC=CA&amp;NR=2540238A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20070915&amp;DB=EPODOC&amp;CC=CA&amp;NR=2540238A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BRETON, PIERETTE</creatorcontrib><creatorcontrib>IOUDOVSKI, ALEXEI</creatorcontrib><title>METHOD AND SYSTEM FOR LOCATING A STRUCTURE OF INTEREST IN ANINTEGRATED CIRCUIT</title><description>A method and system for locating a structure of interest in an integrated circuit uses controlled stimulation of the integrated circuit to stimulate electrical activity in the structure of interest while monitoring electromagnetic waves emitted by the integrated circuit in response to the controlled stimulation. Analysis of the electromagnetic wave emissions permits a location of the structure of interest to be predicted.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPDzdQ3x8HdRcPRzUQiODA5x9VVw8w9S8PF3dgzx9HNXcFQIDgkKdQ4JDXJV8HdT8PQLcQ1yDQ4BMoBaQDz3IMcQVxcFZ88g51DPEB4G1rTEnOJUXijNzaDg5hri7KGbWpAfn1pckJicmpdaEu_saGRqYmBkbOFoaEyEEgCy7y3x</recordid><startdate>20070915</startdate><enddate>20070915</enddate><creator>BRETON, PIERETTE</creator><creator>IOUDOVSKI, ALEXEI</creator><scope>EVB</scope></search><sort><creationdate>20070915</creationdate><title>METHOD AND SYSTEM FOR LOCATING A STRUCTURE OF INTEREST IN ANINTEGRATED CIRCUIT</title><author>BRETON, PIERETTE ; IOUDOVSKI, ALEXEI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CA2540238A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2007</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>BRETON, PIERETTE</creatorcontrib><creatorcontrib>IOUDOVSKI, ALEXEI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BRETON, PIERETTE</au><au>IOUDOVSKI, ALEXEI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD AND SYSTEM FOR LOCATING A STRUCTURE OF INTEREST IN ANINTEGRATED CIRCUIT</title><date>2007-09-15</date><risdate>2007</risdate><abstract>A method and system for locating a structure of interest in an integrated circuit uses controlled stimulation of the integrated circuit to stimulate electrical activity in the structure of interest while monitoring electromagnetic waves emitted by the integrated circuit in response to the controlled stimulation. Analysis of the electromagnetic wave emissions permits a location of the structure of interest to be predicted.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre
recordid cdi_epo_espacenet_CA2540238A1
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title METHOD AND SYSTEM FOR LOCATING A STRUCTURE OF INTEREST IN ANINTEGRATED CIRCUIT
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T05%3A27%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=BRETON,%20PIERETTE&rft.date=2007-09-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECA2540238A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true