METHOD FOR THE CHARACTERISATION OF SURFACE STRUCTURES AND USE THEREOF FOR THE MODIFICATION DEVELOPMENT AND PRODUCTION OF MATERIALS

The invention relates to a method for the characterisation of surface structures, whereby (I) an imprint is taken using a chemically-setting impri nt material of at least one position (I.1) of the undamaged surface of an objec t, (I.2) of a surface of an object damaged by mechanical and/or chemical...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	UPHOFF, HOLGER, HERRMANN, PETRA, STUEBBE, WILFRIED, LOEDDING, BERND
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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