METHOD FOR THE CHARACTERISATION OF SURFACE STRUCTURES AND USE THEREOF FOR THE MODIFICATION DEVELOPMENT AND PRODUCTION OF MATERIALS

The invention relates to a method for the characterisation of surface structures, whereby (I) an imprint is taken using a chemically-setting impri nt material of at least one position (I.1) of the undamaged surface of an objec t, (I.2) of a surface of an object damaged by mechanical and/or chemical...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	UPHOFF, HOLGER, HERRMANN, PETRA, STUEBBE, WILFRIED, LOEDDING, BERND
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	The invention relates to a method for the characterisation of surface structures, whereby (I) an imprint is taken using a chemically-setting impri nt material of at least one position (I.1) of the undamaged surface of an objec t, (I.2) of a surface of an object damaged by mechanical and/or chemical action or the effect of radiation and/or heat and/or (I.3) of a surface of a test specimen, applied to a surface of an object, damaged by mechanical and/or chemical action or the effect of radiation and/or heat, (II) the imprint material is hardened to give a negative of the image of the damage and (III) the area proportion (%) of the surface structures and/or the area proportion (%) of the surface damage in the image of the damage is determined by image analysis using light microscopic scanning of the negative. The invention further relates to use of the method for the modification, development and/or production of materials.