APPARATUS FOR SURFACE IMAGE SENSING AND SURFACE INSPECTION OF THREE-DIMENSIONAL STRUCTURES

An apparatus for providing a two-dimensional image of a three-dimensional object (1) illuminates the surface (11) of the object using an illumination source (2). Portions (6) of the surface are imaged through an aperture (12) in a plate (5) onto a portion (7) of a matrix sensor (3). The object is ro...

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Bibliographische Detailangaben
Hauptverfasser:	HUMPHRIES, MARK ROBSON, FISHER, JOHN HORACE, HODGES, CHRISTOPHER JAMES, CRONSHAW, ANTHONY JAMES
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	An apparatus for providing a two-dimensional image of a three-dimensional object (1) illuminates the surface (11) of the object using an illumination source (2). Portions (6) of the surface are imaged through an aperture (12) in a plate (5) onto a portion (7) of a matrix sensor (3). The object is rotated about its principle axis while being simultaneously translated, and, at the same time the aperture is also rotated. By synchronising these translational and rotational movements, successive portions of the object surface can image onto respective successive portions of the matrix sensor, thereby providing an improved two- dimensional image of the surface of the object.