SYSTEM FOR SURVEILLANCE OF SPECTRAL SIGNALS

The invention is a method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	GROSS, KENNETH C, WEGERICH, STEPHAN, WILKS, ALAN D, CRISS-PUSZKIEWICZ, CYNTHIA
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	ALARM SYSTEMS ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ORDER TELEGRAPHS PHYSICS SIGNALLING SIGNALLING OR CALLING SYSTEMS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	The invention is a method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a learned states (40), a frequency domain transformation carried out for the system signal and reference signal, and a frequency domain difference function is established. The process is then repeated until a full range of data is accumulated over the time domain and an SPRT methodology (50) is applied to determine a three-dimensional surface plot (60) characteristic of the operating state of the system under surveillance.