MICROWAVE TESTING HIGH-POWER DUMMY LOAD FORMING METHOD AND MICROWAVE TESTING HIGH-POWER DUMMY LOAD APPARATUS

In a microwave testing high-power dummy load forming method, a first center conductor, to which microwave power is input, is connected to a power distributor formed from a second center conductor having an output-side distal end branching into a plurality of portions so as to separate the microwave power input to the first center conductor into a plurality of outputs in correspondence with the output-side distal end of the second center conductor. A plurality of termination resistors are connected between the output-side distal end of the second center conductor and a ground conductor to make the termination resistors consume the microwave power. The heat generated by the termination resistors upon consumption of the microwave power is radiated. A microwave testing high-power dummy load apparatus is also disclosed.