CIRCUIT FOR MEAUSURING SOURCE RESISTANCE OF A SENSOR

A method and apparatus are disclosed for measuring a resistance of a sensor. The apparatus injects a first test current into the sensor and then measures a substantially stable first voltage level across the sensor when the first test current is present. The apparatus then injects a second test current into the sensor, the second test current being substantially equal to but opposite in polarity to the first test current. A substantially stable second voltage level across the sensor is measured when the second test signal is present. Using the first measured voltage level and the second measured voltage level, the apparatus calculates the resistance of the sensor.