METHOD OF OPERATING AN ION TRAP MASS SPECTROMETER IN A HIGH RESOLUTION MODE

METHOD OF OPERATING AN ION TRAP MASS SPECTROMETER IN A HIGH RESOLUTION MODE

A method of analyzing a sample trapped within a three-dimensional ion trap which includes combined quadrupole and supplementary A.C. fields in which the combined fields are scanned to resonantly eject ions of consecutive mass-to-charge ratio from the trap at a rate so that the length of time corresp...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: LOURIS, JOHN N, SYKA, JOHN E. P, SCHWARTZ, JAE C
Format: Patent
Sprache:eng ; fre
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A method of analyzing a sample trapped within a three-dimensional ion trap which includes combined quadrupole and supplementary A.C. fields in which the combined fields are scanned to resonantly eject ions of consecutive mass-to-charge ratio from the trap at a rate so that the length of time corresponding to 200 cycles or mor e of the supplementary field occurs per consecutive thomson. A method of analyzing a sample trapped within a three-dimensional ion trap whichincludes combined quadrupole and supplementary A.C. fields in which the combinedfields are scanned to resonantly eject ions of consecutive mass-to-charge ratio from the trap at a rate so that the length of time corresponding to 200 cycles or more of the supplementary field occurs per consecutive thomson.