APPARATUS FOR MEASURING THERMAL DIMENSIONAL CHANGE OF CERAMICS OR THE LIKE

A laser beam-transmitting section of a laser measuring instrument of dimensional change is arranged at one side of a specimen heating furnace, a laser beamreceiving section is arranged at the opposide side of the furnace, a slit fixture for shielding within-the-furnace radiation heat and light is pr...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	MIMURA, TOSHISADA, FUJIWARA, TEIICHI, HISANARI, TOSHIAKI
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A laser beam-transmitting section of a laser measuring instrument of dimensional change is arranged at one side of a specimen heating furnace, a laser beamreceiving section is arranged at the opposide side of the furnace, a slit fixture for shielding within-the-furnace radiation heat and light is provided inside a measuring window, a heat insulating material having a slit for shielding within-the-furnace radiation heat and light is provided inside said slit fixture, and a within-the-furnace radiation light shielding slit plate and a within-the-furnace radiation light reducing optical filter are disposed at the end faces of said respective laser beamtransmitting section and said laser beam-receiving section whereby measuring errors caused by the light and heat generated within the furnace are prevented (the interior of a specimen heating furance core pipe can be replaced by various kinds of atmospheres as necessary, and it is possible to measure the dimensional change of small-size specimens of ceramics or the like). According to the present apparatus for measuring thermal dimensional change of ceramics or the like, measurement is possible with a resolution of not greater than 0.5 .mu.m.