THIRD CASE ASSOCIATED WITH THE FOUR FREQUENCY MEASURING PROCESS FOR COUPLED-DUAL RESONATOR CRYSTALS

THIRD CASE ASSOCIATED WITH THE FOUR FREQUENCY MEASURING PROCESS FOR COUPLED-DUAL RESONATOR CRYSTALS

45MR00600 A third case or manner of obtaining the four critical frequencies useful in accurately measuring coupled-dual resonator crystals, wherein both ports of the crystal structure are monitored, rather than a single port in the previously known cases. Here the B port, for example, is monitored w...

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Bibliographische Detailangaben
Hauptverfasser: DANIELS, JOHN U., JR, TOLIVER, SAMUEL, ROBERTS, GERALD E
Format: Patent
Sprache:eng ; fre
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:45MR00600 A third case or manner of obtaining the four critical frequencies useful in accurately measuring coupled-dual resonator crystals, wherein both ports of the crystal structure are monitored, rather than a single port in the previously known cases. Here the B port, for example, is monitored with the A-side open-circuited or with a capacitor in parallel with it, and the A port is monitored with the B-side short-circuited.