DEVICE MANUFACTURE INVOLVING LITHOGRAPHIC PROCESSING

Fabrication of devices of micron and submicron minimum feature size is accomplished by lithographic processing involving a back focal plane filter. A particularly important fabrication approach depends upon mask patterns which produce images based on discrimination as between scattered and unscatter...

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Bibliographische Detailangaben
Hauptverfasser: BERGER, STEVEN D, GIBSON, JOHN M
Format: Patent
Sprache:eng ; fre
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Beschreibung
Zusammenfassung:Fabrication of devices of micron and submicron minimum feature size is accomplished by lithographic processing involving a back focal plane filter. A particularly important fabrication approach depends upon mask patterns which produce images based on discrimination as between scattered and unscattered radiation by accelerated electrons.