METHOD FOR EVALUATING SMOOTH SURFACES

METHOD FOR EVALUATING SMOOTH SURFACES The short-term and long-term waviness of a smooth surface is determined quantitatively by means of a method which impinges light radiation onto the surface, detects the resultant light image, and mathematically processes that image. The method permits a fast, no...

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Bibliographische Detailangaben
1. Verfasser: HUPP, STEPHEN S
Format: Patent
Sprache:eng ; fre
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Zusammenfassung:METHOD FOR EVALUATING SMOOTH SURFACES The short-term and long-term waviness of a smooth surface is determined quantitatively by means of a method which impinges light radiation onto the surface, detects the resultant light image, and mathematically processes that image. The method permits a fast, non-contact evaluation of a smooth surface with good correlation between the calculated values and the visual observation.