INTERFACE CHECKING METHOD AND APPARATUS

The invention determines the existence of abnormal circuit conditions in lines of a group of interface lines without using redundant duplex lines. The interface lines are subdivided into a first group, used when the present invention is being used to locate abnormal circuit conditions, and a second...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	JACKOWSKI, STEFAN P, MOYER, JAMES T
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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