METHOD OF MAKING EDDY-CURRENT PROBES AND PROBES MADE BY THE METHOD

In a new method of manufacturing eddy-current probes, particularly such probes for the scanning of a test surface generated by a non-flat profile, a thin, flexible support layer is laid against the test surface so that it conforms exactly thereto. One or more test coils have a sector thereof laid ag...

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Bibliographische Detailangaben
Hauptverfasser:	DEWALLE, STEWART, DEWALLE, RICHARD T
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRICITY GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS INDUCTANCES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MAGNETS MEASURING PHYSICS SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TESTING TRANSFORMERS
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Beschreibung
Zusammenfassung:	In a new method of manufacturing eddy-current probes, particularly such probes for the scanning of a test surface generated by a non-flat profile, a thin, flexible support layer is laid against the test surface so that it conforms exactly thereto. One or more test coils have a sector thereof laid against the back face of the support layer so that the coil sector also conforms to the same profile in the plane of the coil and the profile. A plurality of separate ferrite core elements are now laid inside the loop of the coil, or the loops of the coils, and pressed against the coil so as to form a core that also conforms to the profile to be scanned. The remainder of the coil (or coils) is pressed against the backs of the ferrite elements and the assembly is encapsulated to make it rigid enough for mounting in a test apparatus for scanning over the surface to be tested. The front face of the support layer is the "active" surface of the probe and conforms precisely with the profile, since it was generated thereby. The invention includes the probes made by the method.