elemento de detecção opticamente interrogável e método para fabricação de elemento de detecção

Bibliographische Detailangaben

Hauptverfasser:	MICHAEL S. WENDLAND, NEAL A. RAKOW
Format:	Patent
Sprache:	por
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MANUFACTURE OR TREATMENT THEREOF MEASURING NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS,MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES ASDISCRETE UNITS NANOTECHNOLOGY PERFORMING OPERATIONS PHYSICS TESTING TRANSPORTING
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